UnivAQ available laboratories
Non exhaustive loist of other analysis techniques available at the University of L' Aquila that perform external analyzes
X Diffraction (XRD), for analiìysis on the crystalline structure of powders and thin films:
maurizio.passacantando@univaq.it
Atomic force microscopy (AFM) and tunnel effect (STM), for analysis on the morphology of surfaces:
luca.ottaviano@univaq.it
Photoemission X (XPS) for chemical analyssi of surfaces (depth of information <0.01 µm)
luca.lozzi@univaq.it
